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  1. Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
    Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
    Ben Kaczer
    Springer
    Taschenbuch
    BOD - 2 Tage

    Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a show...

    110,35 €
    Alle Preise inkl. MwSt | Versandkostenfrei
  2. Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
    Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
    Ben Kaczer
    Springer
    Buch
    BOD - 7 Tage

    Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a show...

    110,35 €
    Alle Preise inkl. MwSt | Versandkostenfrei
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